CONTACT & STAFF
For more information on this beamline, contact us.
The XDS beamline is an experimental station dedicated to X-ray Diffraction and Spectroscopy in the hard x-rays (5 to 30 keV) energy range. It focuses on determination of atomic, electronic and magnetic structure of materials with applications to condensed matter physics, chemistry, geosciences, among others. Several sample environments are available at XDS: high pressure cells to subject samples up to 80 GPa, magnetic field of 6 T magnet for diffraction experiments, cryostat for temperatures as low as 1.8 K, furnaces for temperatures up to 1200 K.
The X-ray Diffraction and Spectroscopy (XDS) beamline uses the radiation emitted by the Superconducting Wiggler source and is employed for multipurpose experiments. Some of the diffraction experiments demand control of the horizontal divergence, only achievable with sagittal focusing in a double crystal monochromator. On the other hand, the use of flat crystals and focusing with a toroidal mirror was considered to be the best choice for XAS measurements. These apparently contradictory requirements from the diffraction and absorption community led us to introduce a flexible configuration for this beamline. According to this concept, the beamline operates with a collimating mirror with bender (with Si, Rh and Pt stripes), a double crystal monochromator (DCM) with two interchangeable sets of crystals [plane Si(111), sagittal Si(111) and plane Si(311)], and a focusing mirror with three stripes (toroidal Rh, plane Rh and toroidal Pt) and a bending mechanism to allow for focus adjustments.
For more information on this beamline, contact us.
The following experimental techniques and setups are available to users in this beamline. To learn more about the techniques’ limitations and requirements (sample, environment, etc.) contact the beamline coordinator before submitting your proposal.
|SOURCE||Insertion Device||Insertion Device W09A, 4T Superconducting Wiggler, 1.28 x 0.023 m2|
|M1||Cylindrical Vertical Collimating Mirror||11||Si, Rh and Pt coated stripes, θ=2.75 mrad|
|Mono||Double Crystal Monochromator||13.5||Cryo-cooled flat Si(111) and Si(311) pairs; Si(111) with sagital bending|
|M2||Cylindrical and Toroidal Focusing Mirror||16||Rh and Pt coated, θ=2.75 mrad, bending mechanism for vertical focusing, toroidal stripes for horizontal focusing, flat Rh stripe for use with sagittal focusing or unfocus mode|
|Energy range [keV]||5 – 30||Si(111) and Si(311)|
|Energy resolution [ΔE/E]||10-4||Si(111)|
|Energy resolution [ΔE/E]||10-5||Si(311)|
|Beam size at sample [µm2, FWHM]||1400 x 300||at 10 keV|
|Beam divergence at sample [mrad2, FWHM]||2.5 x 0.4||at 10 keV|
|Flux density at sample [ph/s/mm2]||5 x 1012||at 10 keV|
|Detector||Area||Pilatus 300K||Area 83.8 × 106.5 mm2. Pixel size: 172 x 172 µm2, 1kHz frame rate.||Dectris|
|Detector||Fluorescence||SiLi 12 element||–||PGT|
|Furnace||Capillary||HTK 1200N||Max Temp.: 1200ºC, Temp Rate: 50°C/min||Anton Paar|
|Diffractometer||6+2 circle||–||6 circle diffractometer||Huber|
|Sample Cell||High pressure Diamond anvil cell||Membrane and screw driven||Can reach up to 80 GPa||LNLS in-house development, Syntek, Princeton|
|Cryostats||JT Cryostat||Minimum temp.:1.2 K||Closed loop cryostat||A S Scientific|
|Magnet||SC cryo-free||6 T HTS-11||Superconducting magnet||HTS 110|
All beamline controls are done through SPEC software.
Users are required to acknowledge the use of LNLS facilities in any paper, conference presentation, thesis and any other published material that uses data obtained in the execution of their proposal.
F. A. Lima et al., XDS: a flexible beamline for X-ray diffraction and spectroscopy at the Brazilian synchrotron, J. Synchrotron Rad. (2016). 23, 1538–1549
The majority of the beamlines at the Brazilian Synchrotron Light Source Laboratory (LNLS) use radiation produced in the storage-ring bending magnets and are therefore currently limited in the flux that can be used in the harder part of the X-ray spectrum (above ∼10 keV). A 4 T superconducting multipolar wiggler (SCW) was recently installed at LNLS in order to improve the photon flux above 10 keV and fulfill the demands set by the materials science community. A new multi-purpose beamline was then installed at the LNLS using the SCW as a photon source. The XDS is a flexible beamline operating in the energy range between 5 and 30 keV, designed to perform experiments using absorption, diffraction and scattering techniques. Most of the work performed at the XDS beamline concentrates on X-ray absorption spectroscopy at energies above 18 keV and high-resolution diffraction experiments. More recently, new setups and photon-hungry experiments such as total X-ray scattering, X-ray diffraction under high pressures, resonant X-ray emission spectroscopy, among others, have started to become routine at XDS. Here, the XDS beamline characteristics, performance and a few new experimental possibilities are described.
Scientific publications produced with data obtained at the facilities of this beamline, and published in journals indexed by the Web of Science, are listed below.