Laboratório Nacional
de Luz Síncrotron

Português

OVERVIEW

BACK

ABOUT THIS BEAMLINE


The XRD2 beamline an experimental station dedicated to X-ray Diffraction techniques in the hard x-rays range (3 to 17 keV). Several kinds of measurements can be carried out in this beamline, both in monocrystalline or policrystalline samples and thin films with Grazing-Incidence Diffraction (GID), Grazing-Incidence Small-Angle X-ray Scattering (GISAXS) and in-plane diffraction. Applications include crystallographic characterization of monocrystals at low temperatures (2K-400K), microscopic magnetism, orbital ordering studies, and characterization of thin films, quantum dots and heterostructures.

XRD2 source is a 1.67T bending magnet. The diffraction beamline has a versatile 6+2 circles diffractometer allowing to perform a wide range of diffraction/scattering techniques on different sample environments like: furnaces (< 1000°C), cryojet (> 85 K), humidity (or gas flux) chambers and more recently gas/liquid interfaces on a Langmuir trough. The optics is composed by a Rh-coated vertical-focusing mirror and a sagittal-focusing Si 111 double-crystal monochromator. It provides a 0.5 mm x 1.5 mm focus at the sample position with tunable monochromatic beam ranging from 5 to 15 keV.

Some of the usual experiments are multiple x-ray diffraction of single crystals, x-ray reflectometry, reciprocal space mapping of thin films (epitaxial, polycrystalline, textured), grazing incidence small angle x-ray scattering (GISAXS) and diffraction (GID) in supported nanoparticles or gas/liquid interfaces. Phase identification and depth profile of metallurgical alloys.

CONTACT


Beamline Email: xrd2@lnls.br

Beamline Telephone Number: +55 19 3512 1130

Coordinator: Márcio Medeiros Soares

Coordinator Email: marcio.soares@lnls.br

Coordinator Telephone Number: +55 19 3518 2496

For more information on the Beamline Team, check out the Beamline Team’s page here

LAYOUT


OPTICAL ELEMENTS

ElementTypePosition[m]Description
SRCBending Magnet0.000Bending Magnet D10 exit A (4°), 1.67T, 0.87mm x 0.17mm
FEFront-end4.750-
S1White Beam Slits5.995-
M1Cylindrical Vertical Focusing Mirror7.048Rh coated, RT=?, $ \theta$ = 20mrad
DCMDouble Crystal Monochromator8.749Water-cooled Si (111), Sagitally bent
S2Monochromatic Beam Slits14.690-
S3Sample Slits17.100-
ESExperimental Station17.478-

PARAMETERS

ParameterValueObs. | Condition
Energy range [keV]5-15-
Energy resolution [$ \Delta$E/E]$ 8 \times 10^{-4}$-
Beam size at sample [$ \rm mm^{2}$, FWHM]0.5x1.58 keV, vertical and horizontal focus at sample
Beam divergence at sample [$ \rm mrad^{2}$, FWHM]0.6x58 keV, vertical and horizontal focus at sample
Flux density at sample [ph/s/$ \rm mm^{2}$/100mA]$ 5.26 \times 10^{10}$8 keV at sample

INSTRUMENTATION

InstrumentTypeModelSpecificationsManufacturer
Diffractometer6+2 circlesHuber 92784Circles: 4 sample (open eulerian cradle); 2 detector; +2 crystal analyzer; +1 incident angle ($ \pm$ 5°)Huber
Furnaces-F300C300 to 570K Temp. Rate: up to 20K/min Temp. control: 0.1KLNLS in-house development
Furnaces-F1000300 to 1270K Temp. Rate: up to 20K/min Temp. control: 1KLNLS in-house development
Cryogenic-Cryojet5120 to 450K (shared instrument)Oxford
DetectorPunctualCyberstarx1000$ \phi$=30mm, Ti-doped NaI (NaI(TI)), $ 10^6$-
DetectorLinearMythen 1kTotal 1280 pixel with $ 50 \mu m$ each, 2kHz frame rate (shared instrument)Dectris
DetectorLinearMythen 1kTotal 1280 pixel with $ 50 \mu \rm m$ each, 2kHz frame rate (shared instrument)Dectris
DetectorAreaPilatus 100k172x172 $ \mu \rm m^{2}$ pixel area, 487x192 pixel matrixDectris
DetectorAreaPilatus 300k172x172 $ \mu \rm m^{2}$ pixel area, 487x619 pixel matrix (shared instrument)Dectris
Langmuir troughLiquid surface analysis602A62500 $ \rm mm^{2}$, 350 ml, 500mm x 125mm x 3mmNima

CONTROL AND DATA ACQUISITION

The beamline is controlled by the use of EPICS (Experimental Physics and Industrial Control System) running on a PXI from National Instruments. All data acquisition and instrumentation use are done using Psic mode on SPEC (software for instrumentation control and data acquisition in X-ray diffraction experiments from Certified Science Software). Some graphical interfaces and beamline devices can be controlled on CSS (Control System Studio).

 

APPLYING FOR BEAMTIME

Submission calls are usually announced twice per year, one for each semester. All the academic research proposals must be submitted electronically through the SAU Online portal. Learn more about how to submit a proposal here.

 

PHOTOS

XRD2: Visão Geral / Overview



Português:
Visão geral da cabana experimental da linha XRD2 com difratômetro de 6+2 círculos ao centro.

English:
Overview of the XRD2 experimental hutch with 6+2 circles difractometer at center.

XRD2: Detalhe do Arranjo Experimental / Detail of Experimental Setup



Português:
Detalhe do arranjo experimental da XRD2 com amostra no círculo de Euler e fendas anti-espalhamento Xenocs com janela de mica ao fundo.

English:
Detail of XRD2 experimental setup with sample on Eulerian cradle and Xenocs scatterless slits with mica window at background.

XRD2: Detectores / Detectors



Português:
Detectores Pilatus100K e Pilatus300K (partilhado).

English:
Pilatus100K and Pilatus300K (shared) detectors.

XRD2: Fornos / Furnaces



Português:
Fornos F900C e F300C com janela em Kapton.

English:
F900C and F300C furnaces with Kapton window.

XRD2: Cuba de Langmuir / Langmuir Trough



Português:
Cuba de Langmuir e espelho defletor usados no experimento de espalhamento em superfícies líquidas.

English:
Langmuir trough and downward deflecting mirror used for scattering experiments at liquid surface.